TY  - GEN
AU  - Kim,C S
AU  - Jang,Y D
AU  - Shin,D M
AU  - Kim,J H
AU  - Lee,D
AU  - Choi,Y H
AU  - Noh,M S
AU  - Yee,K J
TI  - Estimation of relative defect densities in InGaN laser diodes by induced absorption of photoexcited carriers
SN  - 1094-4087
PY  - 2011///0414
KW  - Equipment Failure Analysis
KW  - methods
KW  - Gallium
KW  - chemistry
KW  - Indium
KW  - Lasers, Semiconductor
KW  - Photometry
KW  - Protons
N1  - Publication Type: Evaluation Study; Journal Article; Research Support, Non-U.S. Gov't
UR  - https://doi.org/10.1364/OE.18.027136
ER  -