de la Peņa, F <br/><br/>
Mapping titanium and tin oxide phases using EELS: an application of independent component analysis.  [electronic resource] 

 -  Ultramicroscopy  Jan 2011 
 - 169-76 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1879-2723 
<br/><br/><label>Standard No.: </label>10.1016/j.ultramic.2010.10.001  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Multivariate Analysis<br/>Oxides--chemistry<br/>Spectroscopy, Electron Energy-Loss<br/>Tin Compounds--chemistry<br/>Titanium--chemistry