Hong, Seung Sae <br/><br/>
One nanometer resolution electrical probe via atomic metal filament formation.  [electronic resource] 

 -  Nano letters  Jan 2011 
 - 231-5 p.  digital 
<br/><br/> Publication Type: Evaluation Study; Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S. 
<br/><br/><label>ISSN: </label>1530-6992 
<br/><br/><label>Standard No.: </label>10.1021/nl103603v  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Equipment Design<br/>Metals--chemistry<br/>Microscopy, Atomic Force--instrumentation<br/>Nanotubes, Carbon--ultrastructure<br/>Sensitivity and Specificity