Gai, Pratibha L <br/><br/>
Probing structures of nanomaterials using advanced electron microscopy methods, including aberration-corrected electron microscopy at the Angstrom scale.  [electronic resource] 

 -  Microscopy research and technique  Jul 2011 
 - 664-70 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S. 
<br/><br/><label>ISSN: </label>1097-0029 
<br/><br/><label>Standard No.: </label>10.1002/jemt.20933  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Graphite--chemistry<br/>Metals--chemistry<br/>Microscopy, Electron--methods<br/>Nanoparticles--chemistry<br/>Nanostructures--chemistry<br/>Zinc Oxide--chemistry