Wisdom, Jeff A <br/><br/>
Laser-gain scanning microscopy: a new characterization technique for dopant engineered gain media.  [electronic resource] 

 -  Optics express  Aug 2010 
 - 18912-21 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S. 
<br/><br/><label>ISSN: </label>1094-4087 
<br/><br/><label>Standard No.: </label>10.1364/OE.18.018912  doi