TY  - GEN
AU  - Fieguth,P W
AU  - Staelin,D H
TI  - High-accuracy profiler that uses depth from focus
SN  - 1559-128X
PY  - 2012///1002
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1364/AO.33.000686
ER  -