Rönnow, D <br/><br/>
Determination of interface roughness by using a spectroscopic total-integrated-scatter instrument.  [electronic resource] 

 -  Applied optics  Jul 1993 
 - 3448-51 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1559-128X 
<br/><br/><label>Standard No.: </label>10.1364/AO.32.003448  doi