Defranzo, A C <br/><br/>
Index of refraction measurement on sapphire at low temperatures and visible wavelengths.  [electronic resource] 

 -  Applied optics  May 1993 
 - 2224-34 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1559-128X 
<br/><br/><label>Standard No.: </label>10.1364/AO.32.002224  doi