TY  - GEN
AU  - Gülker,G
AU  - Haack,O
AU  - Hinsch,K D
AU  - Hölscher,C
AU  - Kuls,J
AU  - Platen,W
TI  - Two-wavelength electronic speckle-pattern interferometry for the analysis of discontinuous deformation fields
SN  - 1559-128X
PY  - 2012///1002
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1364/AO.31.004519
ER  -