Gülker, G <br/><br/>
Two-wavelength electronic speckle-pattern interferometry for the analysis of discontinuous deformation fields.  [electronic resource] 

 -  Applied optics  Aug 1992 
 - 4519-21 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1559-128X 
<br/><br/><label>Standard No.: </label>10.1364/AO.31.004519  doi