Zhao, Zhi-Juan <br/><br/>
[Thickness measurement of ultrathin SiO2 layer on Si by using XPS standard curve].  [electronic resource] 

 -  Guang pu xue yu guang pu fen xi = Guang pu  Jun 2010 
 - 1670-3 p.  digital 
<br/><br/> Publication Type: English Abstract; Journal Article 
<br/><br/><label>ISSN: </label>1000-0593