Schmidt, Th <br/><br/>
Double aberration correction in a low-energy electron microscope.  [electronic resource] 

 -  Ultramicroscopy  Oct 2010 
 - 1358-61 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1879-2723 
<br/><br/><label>Standard No.: </label>10.1016/j.ultramic.2010.07.007  doi