Broch, Laurent <br/><br/>
Second-order systematic errors in Mueller matrix dual rotating compensator ellipsometry.  [electronic resource] 

 -  Applied optics  Jun 2010 
 - 3250-8 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1539-4522 
<br/><br/><label>Standard No.: </label>10.1364/AO.49.003250  doi