Son, Ji Hoon <br/><br/>
Size effect of nano scale phase change random access memory.  [electronic resource] 

 -  Journal of nanoscience and nanotechnology  May 2010 
 - 3165-9 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1533-4880 
<br/><br/><label>Standard No.: </label>10.1166/jnn.2010.2276  doi