Stiegler, J M <br/><br/>
Nanoscale free-carrier profiling of individual semiconductor nanowires by infrared near-field nanoscopy.  [electronic resource] 

 -  Nano letters  Apr 2010 
 - 1387-92 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1530-6992 
<br/><br/><label>Standard No.: </label>10.1021/nl100145d  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Nanotechnology--instrumentation<br/>Nanowires--chemistry<br/>Semiconductors<br/>Spectroscopy, Near-Infrared