Fonck, R J <br/><br/>
All-reflection Michelson interferometer: analysis and test for far ir Fourier spectroscopy.  [electronic resource] 

 -  Applied optics  Jun 1978 
 - 1739-47 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1559-128X 
<br/><br/><label>Standard No.: </label>10.1364/AO.17.001739  doi