Azzam, R M <br/><br/>
Combined reflection and transmission thin-film ellipsometry: a unified linear analysis.  [electronic resource] 

 -  Applied optics  Jul 1975 
 - 1652-63 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1559-128X 
<br/><br/><label>Standard No.: </label>10.1364/AO.14.001652  doi