Watanabe, M <br/><br/>
Improvements in the X-ray analytical capabilities of a scanning transmission electron microscope by spherical-aberration correction.  [electronic resource] 

 -  Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada  Dec 2006 
 - 515-26 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S. 
<br/><br/><label>ISSN: </label>1431-9276 
<br/><br/><label>Standard No.: </label>10.1017/s1431927606060703  doi