Kim, Kyung Joong <br/><br/>
Determination of the absolute thickness of ultrathin Al2O3 overlayers on Si (100) substrate.  [electronic resource] 

 -  Analytical chemistry  Oct 2009 
 - 8519-22 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1520-6882 
<br/><br/><label>Standard No.: </label>10.1021/ac901463m  doi