TY  - GEN
AU  - Jeong,Hoon Eui
AU  - Kwak,Moon Kyu
AU  - Park,Chan Ick
AU  - Suh,Kahp Yang
TI  - Wettability of nanoengineered dual-roughness surfaces fabricated by UV-assisted capillary force lithography
SN  - 1095-7103
PY  - 2009///1029
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1016/j.jcis.2009.07.020
ER  -