TY  - GEN
AU  - Wang,C H
AU  - Yang,Z
TI  - Submicrometer resolution far field high sensitivity Kerr microscopy for in-plane magnetization detection
SN  - 1089-7623
PY  - 2009///1009
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1063/1.3183496
ER  -