Wang, C H <br/><br/>
Submicrometer resolution far field high sensitivity Kerr microscopy for in-plane magnetization detection.  [electronic resource] 

 -  The Review of scientific instruments  Jul 2009 
 - 073107 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1089-7623 
<br/><br/><label>Standard No.: </label>10.1063/1.3183496  doi