Brunner, Matthias J <br/><br/>
Automated monitoring to reduce electron microscope downtime.  [electronic resource] 

 -  Ultramicroscopy  Oct 2009 
 - 1389-92 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1879-2723 
<br/><br/><label>Standard No.: </label>10.1016/j.ultramic.2009.07.003  doi