TY  - GEN
AU  - Lee,Cheng-Chung
AU  - Wu,Kai
AU  - Chen,Sheng-Hui
AU  - Ma,Sheng-Ju
TI  - Optical monitoring and real time admittance loci calculation through polarization interferometer
SN  - 1094-4087
PY  - 2009///0724
KW  - Computer-Aided Design
KW  - Equipment Design
KW  - Equipment Failure Analysis
KW  - Interferometry
KW  - instrumentation
KW  - Light
KW  - Materials Testing
KW  - methods
KW  - Membranes, Artificial
KW  - Refractometry
KW  - Reproducibility of Results
KW  - Scattering, Radiation
KW  - Sensitivity and Specificity
N1  - Publication Type: Journal Article; Research Support, Non-U.S. Gov't
UR  - https://doi.org/10.1364/oe.15.017536
ER  -