Lee, Cheng-Chung <br/><br/>
Optical monitoring and real time admittance loci calculation through polarization interferometer.  [electronic resource] 

 -  Optics express  Dec 2007 
 - 17536-41 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1094-4087 
<br/><br/><label>Standard No.: </label>10.1364/oe.15.017536  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Computer-Aided Design<br/>Equipment Design<br/>Equipment Failure Analysis<br/>Interferometry--instrumentation<br/>Light<br/>Materials Testing--methods<br/>Membranes, Artificial<br/>Refractometry--instrumentation<br/>Reproducibility of Results<br/>Scattering, Radiation<br/>Sensitivity and Specificity