TY  - GEN
AU  - Chiu,Shao-Pin
AU  - Chung,Hui-Fang
AU  - Lin,Yong-Han
AU  - Kai,Ji-Jung
AU  - Chen,Fu-Rong
AU  - Lin,Juhn-Jong
TI  - Four-probe electrical-transport measurements on single indium tin oxide nanowires between 1.5 and 300 K
SN  - 1361-6528
PY  - 2009///0701
KW  - Crystallization
KW  - methods
KW  - Electric Impedance
KW  - Electron Transport
KW  - Macromolecular Substances
KW  - chemistry
KW  - Materials Testing
KW  - Molecular Conformation
KW  - Nanostructures
KW  - Nanotechnology
KW  - Particle Size
KW  - Surface Properties
KW  - Temperature
KW  - Tin Compounds
N1  - Publication Type: Journal Article; Research Support, Non-U.S. Gov't
UR  - https://doi.org/10.1088/0957-4484/20/10/105203
ER  -