TY  - GEN
AU  - Weitz,R Thomas
AU  - Zschieschang,Ute
AU  - Forment-Aliaga,Alicia
AU  - Kälblein,Daniel
AU  - Burghard,Marko
AU  - Kern,Klaus
AU  - Klauk,Hagen
TI  - Highly reliable carbon nanotube transistors with patterned gates and molecular gate dielectric
SN  - 1530-6992
PY  - 2009///0626
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1021/nl802982m
ER  -