Gompf, B <br/><br/>
Tetracene film morphology: comparative atomic force microscopy, X-ray diffraction and ellipsometry investigations.  [electronic resource] 

 -  The European physical journal. E, Soft matter  Dec 2008 
 - 421-4 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1292-895X 
<br/><br/><label>Standard No.: </label>10.1140/epje/i2008-10405-5  doi