Borenstein, Eran <br/><br/>
Combined top-down/bottom-up segmentation.  [electronic resource] 

 -  IEEE transactions on pattern analysis and machine intelligence  Dec 2008 
 - 2109-25 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>0162-8828 
<br/><br/><label>Standard No.: </label>10.1109/TPAMI.2007.70840  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Algorithms<br/>Artificial Intelligence<br/>Image Enhancement--methods<br/>Image Interpretation, Computer-Assisted--methods<br/>Pattern Recognition, Automated--methods<br/>Reproducibility of Results<br/>Sensitivity and Specificity<br/>Subtraction Technique