Chang, Won-Seok <br/><br/>
Resolution enhancing using cantilevered tip-on-aperture silicon probe in scanning near-field optical microscopy.  [electronic resource] 

 -  Ultramicroscopy  Sep 2008 
 - 1070-5 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>0304-3991 
<br/><br/><label>Standard No.: </label>10.1016/j.ultramic.2008.04.078  doi