TY  - GEN
AU  - Lee,Joon Sung
AU  - Ryu,Sunmin
AU  - Yoo,Kwonjae
AU  - Kim,Jinhee
AU  - Choi,Insung S
AU  - Yun,Wan Soo
TI  - Local inhomogeneity in gate hysteresis of carbon nanotube field-effect transistors investigated by scanning gate microscopy
SN  - 0304-3991
PY  - 2008///1204
N1  - Publication Type: Journal Article; Research Support, Non-U.S. Gov't
UR  - https://doi.org/10.1016/j.ultramic.2008.04.067
ER  -