Lee, Joon Sung <br/><br/>
Local inhomogeneity in gate hysteresis of carbon nanotube field-effect transistors investigated by scanning gate microscopy.  [electronic resource] 

 -  Ultramicroscopy  Sep 2008 
 - 1045-9 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>0304-3991 
<br/><br/><label>Standard No.: </label>10.1016/j.ultramic.2008.04.067  doi