Kim, JunHo <br/><br/>
Characterization of nanoscale recording mark on Ge2Sb2Te5 film.  [electronic resource] 

 -  Ultramicroscopy  Sep 2008 
 - 1246-50 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>0304-3991 
<br/><br/><label>Standard No.: </label>10.1016/j.ultramic.2008.04.080  doi