Creemer, J F <br/><br/>
Atomic-scale electron microscopy at ambient pressure.  [electronic resource] 

 -  Ultramicroscopy  Aug 2008 
 - 993-8 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>0304-3991 
<br/><br/><label>Standard No.: </label>10.1016/j.ultramic.2008.04.014  doi