Langford, R M <br/><br/>
In situ lift-out: steps to improve yield and a comparison with other FIB TEM sample preparation techniques.  [electronic resource] 

 -  Micron (Oxford, England : 1993)  Dec 2008 
 - 1325-30 p.  digital 
<br/><br/> Publication Type: Comparative Study; Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>0968-4328 
<br/><br/><label>Standard No.: </label>10.1016/j.micron.2008.02.006  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Microscopy, Electron, Transmission--methods