Tsai, Chien-Chung <br/><br/>
High speed interferometric ellipsometer.  [electronic resource] 

 -  Optics express  May 2008 
 - 7778-88 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1094-4087 
<br/><br/><label>Standard No.: </label>10.1364/oe.16.007778  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Computer Simulation<br/>Computer-Aided Design<br/>Equipment Design<br/>Equipment Failure Analysis<br/>Interferometry--instrumentation<br/>Models, Theoretical<br/>Refractometry--instrumentation