Zhu, Wen <br/><br/>
Electrochemical aspects and structure characterization of VA-VIA compound semiconductor Bi2Te3/Sb2Te3 superlattice thin films via electrochemical atomic layer epitaxy.  [electronic resource] 

 -  Langmuir : the ACS journal of surfaces and colloids  Jun 2008 
 - 5919-24 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>0743-7463 
<br/><br/><label>Standard No.: </label>10.1021/la8001064  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electrochemistry<br/>Membranes, Artificial<br/>Microscopy, Electron, Scanning<br/>Semiconductors<br/>Spectroscopy, Fourier Transform Infrared<br/>Surface Properties<br/>X-Ray Diffraction