Reid, Obadiah G <br/><br/>
Space charge limited current measurements on conjugated polymer films using conductive atomic force microscopy.  [electronic resource] 

 -  Nano letters  Jun 2008 
 - 1602-9 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S. 
<br/><br/><label>ISSN: </label>1530-6984 
<br/><br/><label>Standard No.: </label>10.1021/nl080155l  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Computer Simulation<br/>Electric Impedance<br/>Electromagnetic Fields<br/>Materials Testing--methods<br/>Microscopy, Atomic Force--methods<br/>Models, Chemical<br/>Polymers--chemistry<br/>Semiconductors