Stöger-Pollach, M <br/><br/>
Optical properties and bandgaps from low loss EELS: pitfalls and solutions.  [electronic resource] 

 -  Micron (Oxford, England : 1993)  Dec 2008 
 - 1092-110 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>0968-4328 
<br/><br/><label>Standard No.: </label>10.1016/j.micron.2008.01.023  doi