Simon, J M <br/><br/>
Shifting of localization planes in optical testing: application to a shearing interferometer.  [electronic resource] 

 -  Applied optics  Oct 2001 
 - 4999-5010 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1559-128X 
<br/><br/><label>Standard No.: </label>10.1364/ao.40.004999  doi