Kuwamura, S <br/><br/>
Wavelength scanning profilometry for real-time surface shape measurement.  [electronic resource] 

 -  Applied optics  Jul 1997 
 - 4473-82 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1559-128X 
<br/><br/><label>Standard No.: </label>10.1364/ao.36.004473  doi