TY  - GEN
AU  - Ding,T N
AU  - Garmire,E
TI  - Measuring refractive index and thickness of thin films: a new technique
SN  - 1559-128X
PY  - 2012///1002
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1364/ao.22.003177
ER  -