Ding, T N <br/><br/>
Measuring refractive index and thickness of thin films: a new technique.  [electronic resource] 

 -  Applied optics  Oct 1983 
 - 3177 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1559-128X 
<br/><br/><label>Standard No.: </label>10.1364/ao.22.003177  doi