Mo, Nan <br/><br/>
High precision metrology based microwave effective linewidth measurement technique.  [electronic resource] 

 -  The Review of scientific instruments  Nov 2007 
 - 113903 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>0034-6748 
<br/><br/><label>Standard No.: </label>10.1063/1.2813344  doi