Kim, Kyujung <br/><br/>
Thin-film-based sensitivity enhancement for total internal reflection fluorescence live-cell imaging.  [electronic resource] 

 -  Optics letters  Nov 2007 
 - 3062-4 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>0146-9592 
<br/><br/><label>Standard No.: </label>10.1364/ol.32.003062  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Aluminum Oxide<br/>Carcinoma--pathology<br/>Cell Line, Tumor<br/>Fluorescence<br/>Glass<br/>Humans<br/>Image Enhancement--instrumentation<br/>Microscopy, Fluorescence<br/>Microspheres<br/>Scattering, Radiation<br/>Sensitivity and Specificity<br/>Silicon Dioxide