TY  - GEN
AU  - Smith,R J
TI  - Microchip Problems Plague DOD: Inadequate testing of millions of integrated circuits by Texas Instruments has sown new anxiety about the performance of weapons and spacecraft
SN  - 0036-8075
PY  - 2010///0702
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1126/science.226.4670.24
ER  -