Smith, R J <br/><br/>
Microchip Problems Plague DOD: Inadequate testing of millions of integrated circuits by Texas Instruments has sown new anxiety about the performance of weapons and spacecraft.  [electronic resource] 

 -  Science (New York, N.Y.)  Oct 1984 
 - 24-6 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>0036-8075 
<br/><br/><label>Standard No.: </label>10.1126/science.226.4670.24  doi