Havel, M <br/><br/>
Phonon confinement in SiC nanocrystals: comparison of the size determination using transmission electron microscopy and Raman spectroscopy.  [electronic resource] 

 -  Applied spectroscopy  Aug 2007 
 - 855-9 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>0003-7028 
<br/><br/><label>Standard No.: </label>10.1366/000370207781540187  doi