TY  - GEN
AU  - Bhatt,Pramod
AU  - Prakash,Ram
AU  - Chaudhari,S M
AU  - Reddy,V R
AU  - Phase,D M
TI  - Investigation of Ti layer thickness dependent structural, magnetic, and photoemission study of nanometer range Ti/Ni multilayer structures
SN  - 1533-4880
PY  - 2007///0907
KW  - Crystallization
KW  - methods
KW  - Light
KW  - Macromolecular Substances
KW  - chemistry
KW  - Magnetics
KW  - Materials Testing
KW  - Membranes, Artificial
KW  - Molecular Conformation
KW  - Nanostructures
KW  - Nanotechnology
KW  - Nickel
KW  - Particle Size
KW  - Photometry
KW  - Scattering, Radiation
KW  - Surface Properties
KW  - Titanium
N1  - Publication Type: Journal Article; Research Support, Non-U.S. Gov't
UR  - https://doi.org/10.1166/jnn.2007.773
ER  -