Denecke, Melissa A <br/><br/>
Microanalysis (micro-XRF, micro-XANES, and micro-XRD) of a tertiary sediment using microfocused synchrotron radiation.  [electronic resource] 

 -  Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada  Jun 2007 
 - 165-72 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1431-9276 
<br/><br/><label>Standard No.: </label>10.1017/S1431927607070316  doi